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Revision: 1.17
Committed: Wed Jul 16 10:03:05 2008 UTC (16 years, 9 months ago) by beaucero
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Changes since 1.16: +16 -12 lines
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# User Rev Content
1 ymaravin 1.14 \section{Systematic uncertainties}
2     \label{sec:systematic}
3 ymaravin 1.7 In this section, we estimate systematics uncertainties of the methods
4     used in this analysis. We follow the rule of making conservative estimates
5     throughout this section.
6    
7     \subsection{Modeling systematics}
8    
9     The sources of systematic uncertainties due to modeling of trigger,
10     reconstruction, PDF, and luminosity are described below
11    
12 beaucero 1.2 \begin{itemize}
13 beaucero 1.12 \item {\it Trigger}: the trigger path used to select four categories
14     require leptons to be isolated. Though, the isolation criteria
15     depends on the occupancy of the sub-detectors, the alignment of the
16     tracker (when considering tracker isolation variables), and noise in
17     the calorimeters (when considering a calorimetric isolation), the
18     trigger efficiency is expected to be around 99\%, and therefore, a
19     systematic uncertainty is conservatively estimated as 1\%. From the
20     current analysis of $Z\rightarrow l^+l^-$ in
21 beaucero 1.16 CMS~\cite{Zmumu}~\cite{Zee}, the number of \Z events is estimated of the
22 ymaravin 1.14 order of 50k per 100 pb$^{-1}$ of data analysed. To determine the
23 beaucero 1.16 trigger efficiency ``tag-and-probe'' method~\cite{TP} will be used.
24 beaucero 1.12
25     \item {\it Reconstruction}: we assign 2\% systematic uncertainty per
26     lepton due to initial tracker alignment which is of paramount
27     importance to reconstruct leptons, 2\% and 1\% is assigned for the
28     determination of the charge of the electron and muon candidates,
29     respectively. We assigned a larger electron charge identification
30     uncertainty due to much stronger Bremsstrahlung energy loss which
31     makes the charge identification more difficult. The mismeasurement of
32     the charge is of the order of 2\% in CMSSW\_1\_6\_7 release for
33     electron. The estimation of the fraction with data will be done by
34     looking at the \Z peak without opposite charge requirement. Then
35     number of events within the \Z mass windows asking for two leptons of
36     same sign will give us a estimate of the fraction of mismeasure sign
37     leptons.
38 ymaravin 1.7
39 beaucero 1.12 \item {\it Lepton identification}: we assign 4\% of systematic
40     uncertainty due to efficiency measurement from early data using
41     ``tag-and-probe'' method and 2\% for that for a muon. Additionally we
42     assign a systematic uncertainty on lepton energy scale of 2\% per
43 beaucero 1.15 lepton. The leptons scale will be established using the \Z mass peak.
44 ymaravin 1.7
45     \item {\it PDF uncertainties}: we estimate PDF uncertainties following prescription
46     described in~\cite{OldNote}. The uncertainty is found to be
47 beaucero 1.17 $$ \Delta \sigma_+ ^{tot} = 3.9\% \hspace{0.9cm} \Delta \sigma_- ^{tot} = 3.5\% $$
48 beaucero 1.2
49 ymaravin 1.7 \item {\it Luminosity}: we estimate luminosity uncertainty of 10\%.
50 beaucero 1.2 \end{itemize}
51    
52 ymaravin 1.7 The systematic uncertainties are summarized in Table~\ref{tab:sys}.
53 beaucero 1.2
54 beaucero 1.4 \begin{table}[!tb]
55 beaucero 1.2 \begin{center}
56     \begin{tabular}{|l|c|c|} \hline
57 ymaravin 1.7 & \multicolumn{2}{c|}{Systematic uncertainty} \\
58     Source & on the cross section,\% & on the signficance,\% \\ \hline
59 beaucero 1.2 Luminosity & 10.0 & - \\
60     Trigger & 1.0 & 1.0\\
61 ymaravin 1.7 Lepton reconstruction & 2.0 & 2.0\\
62     Electron charge determination &2.0& 2.0\\
63     Muon charge determination &1.0& 1.0\\
64     Lepton energy scale& 1.0& 1.0\\
65     Electron identification& 4.0 &4.0\\
66     Muon identification& 2.0 &2.0\\
67 beaucero 1.17 PDF uncertainties& + 3.9 & + 3.9\\
68     &- 3.5 & - 3.5 \\ \hline
69 beaucero 1.2 \end{tabular}
70    
71     \end{center}
72 ymaravin 1.7 \caption{Systematic uncertainties for $pp\rightarrow \WZ$ cross section measurement
73 ymaravin 1.13 and significance estimation for 300 \invpb of integrated luminosity.}
74 beaucero 1.2 \label{tab:sys}
75     \end{table}
76    
77    
78 ymaravin 1.7 \subsection{Systematic uncertainties due to background estimation method}
79    
80     In the following we estimate a systematic uncertainty due to estimation
81     of background using the matrix method described in Section~\ref{sec:D0Matrix} above.
82    
83    
84 beaucero 1.2
85 beaucero 1.6 We present here, the result for the case where the $W$ is decaying via
86     an electron.
87 beaucero 1.3
88 beaucero 1.6 Two steps will be used to substract the different background: first,
89     the non peaking background should be substracted, then the background
90     $Z+jets$ will be determine using the method described
91     in~\ref{sec:D0Matrix}.
92    
93 beaucero 1.15 %From the fit, we will consider a systematics error of 10\%.
94 beaucero 1.6
95 beaucero 1.17 If we consider an error $\Delta p$
96     %of 4\%
97     on the fake rate and an error $\Delta \epsilon$
98     %of 1\%
99 beaucero 1.3 on the efficiency on signal to go from loose to tight criteria, we can
100     calculate the error on the estimated background as follow:
101     \begin{equation}
102 beaucero 1.9 \Delta N_j ^{t} = \sqrt{\left(\frac{p\left(N_t - pN_l\right)}{\left(\epsilon -p\right)^2}\right)^2 \times \Delta \epsilon^2
103     +\left(\frac{\epsilon\left(\epsilon N_{l}-N_{t}\right)}{\left(\epsilon -p\right)^2}\right)^2 \times \Delta p^2
104     + \frac{p^2\left(\epsilon^2\Delta N_{l}^2 - \Delta N_{t}^2\left(2\epsilon -1\right)\right)}{\left(\epsilon -p\right)^2}}
105 beaucero 1.3 \end{equation}
106 beaucero 1.6 where $N_{t}$,$\Delta N_{t}$ and $N_{l}$,$\Delta N_{l}$ represents
107     respectivement the number of events in the tight sample and in the
108     loose sample and their errors.$\epsilon$ represent efficiency for a
109 beaucero 1.17 loose electron to pass the tight criteria.
110     %, $\Delta \epsilon$ the error on this value.
111     $p$ gives the probability for a fake loose electron to
112     pass also the tight criteria.
113     %and $\Delta p$ its error.
114 beaucero 1.3
115 beaucero 1.15 %The overall error from the background substraction is XXX %18\%.
116 beaucero 1.3
117 beaucero 1.4 \subsection{Summary of Systematics}
118    
119     In table~\ref{tab:FullSys}, the systematics errors are expressed for
120     each channels.
121    
122     \begin{table}[!tb]
123     \begin{center}
124     \begin{tabular}{|l|c|c|} \hline
125     Channels & Cross Section & Signficance \\ \hline
126 beaucero 1.17 3e & +9.3\% / - 9.2\% +10\% = +13.7\% / -13.6\% & +9.3\% / - 9.2\% \\
127     2e1$\mu$ & +8.7\% / - 8.5\% +10\% = +13.3\% / -13.1\% & +8.7\% / - 8.5\% \\
128     1e2$\mu$ & +7.6\% / - 7.4\% +10\% = +12.7\% / -12.4\% & +7.6\% / - 7.4\% \\
129     3$\mu$ & +6.7\% / - 6.5\% +10\% = +12.0\% / -11.9\% & +6.7\% / - 6.5\% \\\hline
130 beaucero 1.4 \end{tabular}
131    
132     \end{center}
133 ymaravin 1.13 \caption{Systematics per channels in percent for $pp\rightarrow WZ$ cross section measurement and significance estimation for 300 \invpb of integrated luminosity. These systematics do not include the background substraction.}
134 beaucero 1.4 \label{tab:FullSys}
135     \end{table}
136