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# Content
1 \section{Signal extraction}
2 \label{sec:SignalExt}
3 We separate backgrounds into three categories: physics background
4 from \Z$\gamma$ and \ZZ processes, with a genuine \Z boson from
5 $\Z+jets$ processes, and finally without a genuine \Z boson from
6 $t\bar{t}$ and $\W+jet$ production.
7
8 The first physics background from \ZZ production is estimated from
9 Monte Carlo simulation. We assigning a very conservative 100\%
10 uncertainty on the estimated \ZZ contribution due to modeling of
11 kinematics of the decay products. The second physics
12 background from \Z$\gamma$ processes is estimated from Monte Carlo
13 simulation as well, although it can be determined from data once the FSR
14 $\Z\gamma$ signal is measured at CMS. We also assign a conservative 100\%
15 systematic uncertainty on the \Z$\gamma$ background contribution due
16 to modeling of the photon conversion probability.
17
18 Instrumental backgrounds from processes with misidentified leptons
19 attributed to \Z candidate decay products can be estimated from the
20 side-bands of the \Z candidate invariant mass distribution. However,
21 the background is relatively small. We estimate this background to contribute
22 at about 6\% level to the \WZ signal sample and about 20\% of the full
23 background processes. That corresponds to less than 8 events combined
24 for all four signatures for integrated luminosity of 1 \invfb.
25 Thus, it is impractical to infer this background from a sideband
26 fit. Thus, we estimate this background from Monte Carlo simulation
27 and we assign a conservative 100\% systematic uncertainty on the contribution
28 due to modeling of the $t\bar{t}+jets$ and $\W+jets$ background in
29 Monte Carlo simulation.
30
31 The remaining, largest background is from \Z+misidentified lepton processes
32 that we describe in details below.
33
34 \subsection{Matrix method}
35 \label{sec:D0Matrix}
36 In this Section the ``loose'' and ``tight'' lepton requirements
37 are defined in Section~\ref{sec:looseTight}.
38
39 The idea of a method is to apply ``loose'' identification criteria
40 on the third lepton after \Z boson candidate is identified
41 and count the number of the observed events, $N_{loose}$.
42 These events contain events with real leptons $N_{l}$
43 and events with misidentified jets $N_j$:
44 \begin{equation}
45 \label{eq:matrixEq1}
46 N_{loose} = N_l + N_j.
47 \end{equation}
48
49 If we are to apply ``tight'' selection on the third lepton, the number
50 of the observed events $N_{tight}$ would change as following
51 \begin{equation}
52 \label{eq:matrixEq2}
53 N_{tight} = \epsilon_{tight} N_l + p_{fake} N_j,
54 \end{equation}
55 where $\epsilon_{tight}$ and $p_{fake}$ are efficiency of ``tight''
56 criteria with respect to ``loose'' requirements for leptons and
57 misidentified jets, respectively. As $N_{loose}$ and $N_{tight}$
58 are directly observable, to extract the number of $Z+jet$ events
59 in the final sample, one needs to measure $\epsilon_{tight}$
60 and $p_{fake}$ in control data samples as described in the next
61 two sections.
62
63 If $\epsilon_{tight}$ and $p_{fake}$ are measured as functions of some
64 variable, for example, lepton $p_T$, then it is possible to estimate
65 the background as function of $p_T$ by applying the matrix method to
66 binned distribution of $dN_{tight}/dp_T$ and $dN_{loose}/dp_T$.
67
68 \subsubsection{Determination of $\epsilon_{tight}$}
69
70 To estimate the $\epsilon_{tight}$ we apply ``tag-and-probe'' method
71 using $\Z \to \ell\ell$ from \Z+jets Chowder sample, including \W+jets
72 and $t\bar{t}$ as background. \Z mass distribution is separated for two cases where
73 leptons from \Z boson decay either both pass ``tight'' selection (``tight-tight'' case), or only
74 one passes the ``tight'' selection, while the other electron passes ``loose'' but not ``tight''
75 selection (``tight-loose'' case).
76
77 Equation for determination of signal efficiency is given as
78 \begin{equation}
79 \epsilon_{tight}=\frac{ 2(N_{TT}-B_{TT}) }{ (N_{TL}-B_{TL})+2(N_{TT}-B_{TT}) }
80 \label{eq:errmatrix}
81 \end{equation}
82
83 where $N_{TT}$, $B_{TT}$, $N_{TL}$, and $B_{TL}$ are numbers of signal plus background
84 and background events for ``tight-tight'' and ``loose-tight'' electron combinations,
85 respectively. We estimated an efficiency for both electrons and muons to be
86 $\epsilon_{tight}=0.98 \pm 0.01$.
87
88 \subsubsection{Determination of $p_{fake}$}
89
90 The probability of a jet to be misidentified as a lepton depends on
91 $p_T$, $\eta$, and composition of quarks and gluons. Although the
92 light quark and gluons have a very similar misidentification rate
93 (see Fig.~\ref{fig:pfake_gg_qq}), this rate can be different for jets
94 enriched with heavy quark jets. Thus, we propose to measure the
95 $p_{fake}$ in the \W+jets sample, as jets in this sample has a very
96 similar composition as those in \Z+jets process, the major background
97 to the signal.
98
99 \begin{figure}[bt]
100 \begin{center}
101 \scalebox{0.4}{\includegraphics{figs/pfake_gg_qq.eps}}
102 \caption{The misidentification probability $p_{fake}$ measured in light-quark jets (left),
103 and gluon jets (right) using multi-jet {\sl ALPGEN} Monte Carlo simulation.}
104 \label{fig:pfake_gg_qq}
105 \end{center}
106 \end{figure}
107
108 We select the \W+jets sample for electron misidentification study as follows:
109 \begin{itemize}
110 \item event must be triggered by the HLTSingleMuonIso trigger,
111 \item event must not have a \Z boson candidate with an invariant mass between 50 and 120 GeV,
112 \item event must have a muon candidate within the acceptance with $p_T >$ 20 GeV satisfying
113 isolation and impact parameter significance requirements; the transverse mass of the muon candidate
114 and the MET in the event must exceed 50 GeV,
115 \item event must have only one electron candidate that satisfies loose identification requirements with $p_T > 20$ GeV,
116 isolated from the muon candidate by $\Delta R > 0.1$,
117 \item muon and electron must have the same charge to suppress $t\bar{t}$ events with real muon and electrons from \W
118 boson decays.
119 \end{itemize}
120 The ``tight'' criteria is just an application of the above-mentioned requirements with an additional criterion
121 on the electron candidate to pass ``tight'' electron identification criteria.
122
123 The probability $p_{fake}$ is then measured as the ratio of the $p_T$ distribution of the ``tight'' electron
124 candidates to the $p_T$ distribution of the ``loose'' electron candidates in the original sample. This
125 probability agrees well with the one obtained from the multi-jet sample and is given in Fig.~\ref{fig:pfake_w}.
126 The errors correspond to statistical errors expected for a data sample with integrated luminosity of 300 \invpb.
127 Thus, it is possible to extract $p_{fake}$ with $\sim$10\% accuracy with early CMS data.
128 \begin{figure}[hbt]
129 \begin{center}
130 \scalebox{0.6}{\includegraphics{figs/pFake_300pb_WX_TTbar.eps}}
131 \caption{Probability of a misidentified jet from \W+jet processes that passed ``loose'' electron identification
132 requirements to also pass tight ones as function of the candidate's $p_T$. The errors correspond to
133 statistical errors expected for a 300 \invpb integrated luminosity. The distribution is also fit to a
134 constant to extract the flat $p_{fake}$ factor. }
135 \label{fig:pfake_w}
136 \end{center}
137 \end{figure}
138
139 A similar method can be used to extract the $p_{fake}$ for the muon misidentification as well.
140
141 \subsubsection{Cross-check of the $p_{fake}$ using multi-jet sample}
142
143 In the following we perform an additional cross-check of $p_{fake}$ measured
144 in different control sample, enriched with multi-jet processes. In the sample,
145 selected with jet triggers, we select a ``loose'' electron candidates that are
146 separated from the jet that satisfied the trigger requirement. These candidates
147 are dominated by the misidentified light quark and gluon jets. The admixture
148 of converted photons from $\gamma + jets$ is small at the low-$p_T$ range and is
149 neglected.
150 The $p_{fake}$ function of $p_T$ and $\eta$ is obtained by dividing the $p_T$ and $\eta$
151 distributions for the electron candidate that satisfied ``tight''
152 electron identification requirements to that for electron candidates
153 that satisfied ``loose''. We estimate the $p_{fake}=0.32 \pm 0.04$ for
154 electrons.
155
156 For muons, a similar procedure has been applied. Since the bulk
157 of background muons is coming from heavy quark decays, we select
158 a $b\bar{b}$ sample as control sample. As an exercise, we selected
159 electron-triggered events on a $b\bar{b}$ Monte Carlo sample,
160 required one ``loose electron'' in the event and looked for
161 for muon candidates that are not close to the electron candidate,
162 and determined $p_{fake}$ on this sample of muons. The $p_T$ spectrum
163 for ``loose'' and ``tight'' muons and their ratio is shown in
164 Figure~\ref{fig:mu_pfake}. The factor $p_{fake}$ for muons estimated
165 in this way amounts to $0.08 \pm 0.01$.
166
167
168 \begin{figure}[bt]
169 \begin{center}
170 \scalebox{0.6}{\includegraphics{figs/tight_eff_gumbo.eps}}
171 \caption{Fraction of electron candidates passing the ``tight'' criteria
172 in multi-jet event. No trigger requirement has been applied.}
173 \label{fig:qcd_efftight_noHLT}
174 \end{center}
175 \end{figure}
176
177 \begin{figure}[!bt]
178 \begin{center}
179 \scalebox{0.6}{\includegraphics{figs/p0_p_fake_mu_fit.eps}}
180 \caption{Determination of $p_{fake}$ for muons. Top plot: $p_T$ spectrum
181 of muons passing the ``loose'' and ``tight'' criteria in $b\bar{b}$ events
182 in the ``Stew'' soup that corresponds to 20 \invpb of integrated luminosity,
183 accepted by electron triggers; bottom plot: fraction of muon candidates
184 passing the ``tight'' criteria. A constant fit is overlayed.}
185 \label{fig:mu_pfake}
186 \end{center}
187 \end{figure}
188
189
190
191 \subsubsection{Background determination results}
192
193 \begin{table}[h]
194 \begin{center}
195 \begin{tabular}{lcccc} \hline \hline
196 & 3e &2e1$\mu$ & 2$\mu$1e &3$\mu$\\ \hline
197 $N$ - ZZ - Z$\gamma$ - W+jets - $t\bar{t}$ & 18.1$\pm$1.7 & 17.7$\pm$6.2 & 22.3$\pm$1.4 & 20.0$\pm$5.9\\ \hline
198 $N^{genuine~Z}$ (matrix method) & 10.1 $\pm$3.2 & 9.4 $\pm$6.7 & 14.5 $\pm$2.9 & 9.4 $\pm$6.4\\ \hline
199 $N^{WZ}$ & 8.0 $\pm$3.6 & 8.3 $\pm$9.1 & 7.8 $\pm$3.2 & 10.6 $\pm$8.7\\ \hline
200 \WZ from MC &8.1&9.0& 9.2 &11.3\\
201 \hline
202 \end{tabular}
203 \caption{Expected number of events for an integrated luminosity of 300 \invpb for the signal
204 and estimated background for 81 GeV $< M_Z < $ 101 GeV with ``loose'' \W lepton criteria.}
205 \label{tab:FinalNoFitloose}
206 \end{center}
207 \end{table}
208
209 \begin{table}[h]
210 \begin{center}
211 \begin{tabular}{lcccc} \hline \hline
212 & 3e &2e1$\mu$ &2$\mu$1e &3$\mu$\\ \hline
213 $N$ - ZZ -Z$\gamma$ - W+jets - $t\bar{t}$ &11.1$\pm$1.3 &8.2$\pm$0.9 &12.1$\pm$1.2 &10.5$\pm$0.8\\ \hline
214 $N^{genuine~Z}$ (matrix method) &3.2 $\pm$1.7 &0.6 $\pm$0.8 &4.6 $\pm$2.0 &0.6 $\pm$0.9\\ \hline
215 $N^{\WZ}$ &7.9 $\pm$2.1 &7.6 $\pm$1.2 &7.5 $\pm$2.3 &10.0$\pm$1.2\\ \hline
216 \WZ from MC &7.9&8.1& 9.0 &10.1\\ \hline
217 \end{tabular}
218 \caption{Expected number of events for an integrated luminosity of 300 \invpb for the signal
219 and estimated background for 81 GeV $< M_Z < $ 101 GeV and ``tight'' \W lepton requirement.}
220 \label{tab:FinalNoFit}
221 \end{center}
222 \end{table}
223
224 Using the values of $\epsilon_{tight}$ and $p_{fake}$ obtained
225 from the methods described in the previous sections, we estimated
226 the backgrounds from genuine \Z decays by solving Eqs.~\ref{eq:matrixEq1}
227 and \ref{eq:matrixEq2} for $N_j$. The comparisons between predicted and true MC
228 backgrounds are given in Tables~\ref{tab:FinalNoFitloose} and \ref{tab:FinalNoFit}
229 for ``loose'' and ``tight'' \W lepton, respectively.
230 The agreement between estimated and MC true backgrounds is excellent.
231
232
233 \clearpage