| 36 |
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|
| 37 |
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We thus pursue two strategies. The first is an inclusive strategy which selects events with a Z$\to\ell\ell$ candidate, |
| 38 |
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at least two jets, and large \MET. This strategy is useful for targeting, e.g., the production of Z bosons in the |
| 39 |
< |
cascades decays of strongly-interacting particles as depicted in Fig.~\ref{fig:diagrams} (left). In the second strategy, |
| 39 |
> |
cascade decays of strongly-interacting particles as depicted in Fig.~\ref{fig:diagrams} (left). In the second strategy, |
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we impose additional requirements which strongly suppress the backgrounds while retaining high efficiency for events |
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< |
with Z bosons produced via direct production of the weakly-coupled charginos and neutralinos. These two strategies |
| 42 |
< |
are referred to as the ``inclusive search'' and the ``targeted search,'' respectively. |
| 41 |
> |
with Z bosons produced via direct production of the weakly-coupled charginos and neutralinos. |
| 42 |
> |
These two strategies are referred to as the ``inclusive search'' and the ``targeted search,'' respectively. |
| 43 |
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|
| 44 |
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After selecting events with jets and a $\Z\to\ell^+\ell^-$ ($\ell=e,\mu$) candidate, |
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the dominant background consists of SM \Z production accompanied by jets from initial-state radiation (\zjets). |
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\MET\ from jet mismeasurements. In this note, the \zjets\ background is estimated with the \MET templates technique, |
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in which the artificial \MET in \zjets events is modeled using a \gjets control sample. |
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The second background category consists of processes which produce leptons with uncorrelated flavor. |
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These ``flavor-symmetric'' (FS) backgrounds, which are dominated by \ttbar but also contain WW, DY$\to\tau\tau$ |
| 54 |
> |
These ``flavor-symmetric'' (FS) backgrounds, which are dominated by \ttbar\ but also contain WW, DY$\to\tau\tau$ |
| 55 |
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and single top processes, are estimated using a data control sample of e$\mu$ events. |
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Additional backgrounds from WZ and ZZ production are estimated from MC, after validation of the MC modeling |
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of these processes using 3-lepton and 4-lepton data control samples. |
