| 12 |
|
Nevertheless, we can make general statements about the |
| 13 |
|
systematic uncertainties, including quantitative |
| 14 |
|
estimates of the systematic uncertainties associated with |
| 15 |
< |
a few specific processes. |
| 15 |
> |
a few specific processes. Note that we have used Spring10 |
| 16 |
> |
MC for the studies of systematic uncertainties described in this section, |
| 17 |
> |
and we are currently checking if any of the reported values |
| 18 |
> |
change after switching to Fall10 MC. |
| 19 |
|
|
| 20 |
|
The systematic uncertainty on the lepton acceptance consists |
| 21 |
|
of two parts: the trigger efficiency uncertainty and the |
| 22 |
< |
ID and isolation of uncertainty. We discuss these in turn. |
| 22 |
> |
ID and isolation uncertainty. We discuss these in turn. |
| 23 |
|
|
| 24 |
|
The trigger efficiency |
| 25 |
|
for two leptons of $P_T>10$ GeV, with one lepton of |
| 26 |
|
$P_T>20$ GeV is very high, except in some corners |
| 27 |
< |
of phase space, see Section~\ref{sec:trgEff}. |
| 27 |
> |
of phase space, see Section~\ref{sec:trgeffsum}. |
| 28 |
|
We estimate the efficiency uncertainty to be a few percent, |
| 29 |
|
mostly in the low $P_T$ region. |
| 30 |
|
|
| 31 |
|
\begin{figure}[tbh] |
| 32 |
|
\begin{center} |
| 33 |
< |
\includegraphics[width=1.0\linewidth]{eff_35.png} |
| 34 |
< |
\includegraphics[width=1.0\linewidth]{isoEff.png} |
| 33 |
> |
\includegraphics[width=1.0\linewidth]{ttdilD6T_eff_Dec02_38X.png} |
| 34 |
> |
\includegraphics[width=1.0\linewidth]{lm_eff_Dec02_38X.png} |
| 35 |
|
\caption{\label{fig:effttbar}\protect |
| 36 |
|
Identification and isolation efficiencies for |
| 37 |
|
leptons from $t \to W \to \ell$ and |
| 45 |
|
\begin{center} |
| 46 |
|
\caption{\label{tab:tagandprobe} Tag and probe results on $Z \to \ell \ell$ |
| 47 |
|
on data and MC. We quote ID efficiency given isolation and |
| 48 |
< |
the isolation efficiency given ID.} |
| 48 |
> |
the isolation efficiency given ID. {\bf \color{red} UPDATE WITH 38X }} |
| 49 |
|
\begin{tabular}{|l||c|c|} |
| 50 |
|
\hline |
| 51 |
|
& Data T\&P & MC T\&P \\ \hline |
